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Are advanced DfT structures sufficient for preventing scan-attacks?, , , and . VTS, page 246-251. IEEE Computer Society, (2012)A smart test controller for scan chains in secure circuits., , , and . IOLTS, page 228-229. IEEE, (2013)SI ECCS: SECure context saving for IoT devices., , , , , and . DTIS, page 1-2. IEEE, (2018)A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis., , and . J. Electron. Test., 17 (3-4): 331-339 (2001)Providing Confidentiality and Integrity in Ultra Low Power IoT Devices., , , , , and . DTIS, page 1-6. IEEE, (2019)Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (3): 538-550 (2019)A Reliable Architecture for Parallel Implementations of the Advanced Encryption Standard., , , and . J. Electron. Test., 25 (4-5): 269-278 (2009)Encryption of test data: which cipher is better?, , , , , and . PRIME, page 85-88. IEEE, (2018)A Comprehensive Approach to a Trusted Test Infrastructure., , , , , , , , , and 1 other author(s). IVSW, page 43-48. IEEE, (2019)A 3D IC BIST for pre-bond test of TSVs using ring oscillators., , , , and . NEWCAS, page 1-4. IEEE, (2013)