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Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation.

S. Wang, H. Al-Awadhi, S. Hamada, Y. Higami, H. Takahashi, H. Iwata, and J. Matsushima. ATS, page 209-214. IEEE Computer Society, (2016)

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Jun Jun Lu

Meta Jun

Jun Yamamoto

Jaeho Jun

Jun Liu

Other publications of authors with the same name

Automotive Functional Safety Assurance by POST with Sequential Observation.S. Wang, Y. Higami, H. Takahashi, H. Iwata, and J. Matsushima. IEEE Des. Test, 35 (3): 39-45 (2018)Test Point Insertion for Multi-Cycle Power-On Self-Test.S. Wang, X. Zhou, Y. Higami, H. Takahashi, H. Iwata, Y. Maeda, and J. Matsushima. ACM Trans. Design Autom. Electr. Syst., 28 (3): 46:1-46:21 (2023)Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation.S. Wang, H. Al-Awadhi, S. Hamada, Y. Higami, H. Takahashi, H. Iwata, and J. Matsushima. ATS, page 209-214. IEEE Computer Society, (2016)A Power Reduction Method for Scan Testing in Ultra-Low Power Designs.H. Iwata, Y. Maeda, and J. Matsushima. ATS, page 141. IEEE, (2021)An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms.H. Iwata, Y. Maeda, J. Matsushima, and M. Takakura. Asian Test Symposium, page 1. IEEE Computer Society, (2012)Multi-configuration Scan Structure for Various Purposes.H. Iwata, and J. Matsushima. ATS, page 131. IEEE Computer Society, (2016)CooLBIST: An Effective Approach of Test Power Reduction for LBIST.J. Matsushima, Y. Maeda, and M. Takakura. ATS, page 264. IEEE Computer Society, (2008)A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule.M. Kurimoto, J. Matsushima, S. Ohbayashi, and Y. Fukui. ISQED, page 184-190. IEEE, (2010)A 16 nm FinFET Heterogeneous Nona-Core SoC Supporting ISO26262 ASIL B Standard.S. Shibahara, C. Takahashi, K. Fukuoka, Y. Kitaji, T. Irita, H. Hara, Y. Shimazaki, and J. Matsushima. IEEE J. Solid State Circuits, 52 (1): 77-88 (2017)A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule.M. Kurimoto, J. Matsushima, S. Ohbayashi, Y. Fukui, M. Komoda, and N. Tsuda. ACM Trans. Design Autom. Electr. Syst., 17 (2): 17:1-17:22 (2012)

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Disambiguation of "Matsushima, Jun"

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Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation.

Please choose a person to relate this publication to

Jun Jun Lu

Meta Jun

Jun Yamamoto

Jaeho Jun

Jun Liu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Matsushima, Jun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation.

Please choose a person to relate this publication to

Jun Jun Lu

Meta Jun

Jun Yamamoto

Jaeho Jun

Jun Liu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation.