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A self-sustaining Single Photon Avalanche Diode Model., , , , , , , , , and 5 other author(s). ESSDERC, page 281-284. IEEE, (2022)Fast Measurement of BTI on 28nm Fully Depleted Silicon-On-Insulator MOSFETs at Cryogenic Temperature down to 4K., , , , , , , , , and . IRPS, page 7. IEEE, (2022)Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs., , , , , , , , , and 25 other author(s). ESSDERC, page 144-147. IEEE, (2023)Analog RF and mm-Wave design Tradeoff in UTBB FDSOI: Application to a 35 GHz LNA., , , , and . MIXDES, page 57-62. IEEE, (2018)Analog and RF modeling of FDSOI UTBB MOSFET using Leti-UTSOI model., , , , , , and . MIXDES, page 41-46. IEEE, (2016)Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs., , , , , , , and . ESSDERC, page 242-245. IEEE, (2018)Characterization and Modeling of Gate-Induced-Drain-Leakage., , , , , , , and . IEICE Trans. Electron., 88-C (5): 829-837 (2005)Characterization Methodology for MOSFET Local Systematic Variability in Presence of Statistical Variability., , , and . J. Low Power Electron., 10 (1): 127-136 (2014)Statistical Estimation of Dominant Physical Parameters for Leakage Variability in 32 Nanometer CMOS, Under Supply Voltage Variations., , , , , , and . J. Low Power Electron., 8 (1): 113-124 (2012)