( en | de | ru )

 

Disambiguation of "Jone, Wen-Ben"

Author of the publication

copydeleteadd this publication to your clipboard
Design and design automation of rectification logic for engineering change.

, , , and . ASP-DAC, page 1006-1009. ACM Press, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Martina Jonen

Lars Jonetz-Mentzel

Hugh Jones

Josef Edgar Jonek

Stefan Joneleit

 

Other publications of authors with the same name

Turbo1500: Core-Based Design for Test and Diagnosis., , , , , , , , , and 5 other author(s). IEEE Des. Test Comput., 26 (1): 26-35 (2009)On random testing for combinational circuits with a high measure of confidence., and . IEEE Trans. Syst. Man Cybern., 22 (4): 748-754 (1992)Defect Level Estimation for Pseudorandom Testing Using Stochastic Analysis., , , and . VLSI Design, 12 (4): 457-474 (2001)Fault Modeling and Detection for Drowsy SRAM Caches., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (6): 1084-1100 (2007)A coordinated circuit partitioning and test generation method for pseudo-exhaustive testing of VLSI circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (3): 374-384 (1995)Pseudorandom test-length analysis using differential solutions., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 15 (7): 815-825 (1996)Delay Fault Coverage Enhancement Using Variable Observation Times., , and . J. Electron. Test., 11 (2): 131-146 (1997)DyXY: a proximity congestion-aware deadlock-free dynamic routing method for network on chip., , and . DAC, page 849-852. ACM, (2006)Design theory and implementation for low-power segmented bus systems., , , , and . ACM Trans. Design Autom. Electr. Syst., 8 (1): 38-54 (2003)Fault simulation and response compaction in full scan circuits using HOPE., , , , , and . IEEE Trans. Instrumentation and Measurement, 54 (6): 2310-2328 (2005)