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Disambiguation of "Balakrishnan, Kedarnath J."

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Emerging Techniques for Test Data Compression.

. Asian Test Symposium, page 462. IEEE Computer Society, (2005)

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Sangeetha Balakrishnan

Balakrishnan Venkatesh

Karthikeyan Balakrishnan

Veeramuthu Balakrishnan

Karthik Balakrishnan

 

Other publications of authors with the same name

Scan-Based BIST Diagnosis Using an Embedded Processor., and . DFT, page 209-216. IEEE Computer Society, (2003)Relating entropy theory to test data compression., and . ETS, page 94-99. IEEE Computer Society, (2004)Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor., , and . IEEE Des. Test Comput., 26 (1): 52-59 (2009)Compressing Functional Tests for Microprocessors., , and . Asian Test Symposium, page 428-433. IEEE Computer Society, (2005)Test access mechanism for multiple identical cores., , , , and . ITC, page 1-10. IEEE Computer Society, (2009)X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors., , and . IEEE Trans. Computers, 57 (7): 978-989 (2008)Relationship Between Entropy and Test Data Compression., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (2): 386-395 (2007)Reconfigurable Linear Decompressors Using Symbolic Gaussian Elimination., and . DATE, page 1130-1135. IEEE Computer Society, (2005)Matrix-based software test data decompression for systems-on-a-chip., and . J. Syst. Archit., 50 (5): 247-256 (2004)Test cost reduction for SoC using a combined approach to test data compression and test scheduling., and . DATE, page 39-44. EDA Consortium, San Jose, CA, USA, (2007)