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Testability Prediction for Sequential Circuits Using Neural Network.

, , , and . Asian Test Symposium, page 48-. IEEE Computer Society, (1997)

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A New Algorithm for Performing Ratings-Based Collaborative Filtering., , and . APWeb, volume 2642 of Lecture Notes in Computer Science, page 239-250. Springer, (2003)Testability Prediction for Sequential Circuits Using Neural Network., , , and . Asian Test Symposium, page 48-. IEEE Computer Society, (1997)Non-Almost-Derivable Frequent Itemsets Mining., , , , , and . CIT, page 157-161. IEEE Computer Society, (2005)A conversation with Professor Bole Shi.. SIGKDD Explor., 13 (2): 85-86 (2011)