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s Write Throughput at Tj of 170°C.

Y. Taito, T. Kono, M. Nakano, T. Saito, T. Ito, K. Noguchi, H. Hidaka, and T. Yamauchi. IEEE J. Solid State Circuits, 51 (1): 213-221 (2016)

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Jean Oscar Kono Kono

Takashi Seki

Takashi Iwata

Takashi Tsuno

Takashi Numaguchi

Other publications of authors with the same name

7.6 A 90nm embedded 1T-MONOS flash macro for automotive applications with 0.07mJ/8kB rewrite energy and endurance over 100M cycles under Tj of 175°C.H. Mitani, K. Matsubara, H. Yoshida, T. Hashimoto, H. Yamakoshi, S. Abe, T. Kono, Y. Taito, T. Ito, T. Krafuji and 3 other author(s). ISSCC, page 140-141. IEEE, (2016)7.3 A 28nm embedded SG-MONOS flash macro for automotive achieving 200MHz read operation and 2.0MB/S write throughput at Ti, of 170°C.Y. Taito, M. Nakano, H. Okimoto, D. Okada, T. Ito, T. Kono, K. Noguchi, H. Hidaka, and T. Yamauchi. ISSCC, page 1-3. IEEE, (2015)Session 11 overview: Nonvolatile memory solutions.T. Kono, K. Park, and L. Chang. ISSCC, page 194-195. IEEE, (2017)A 667-Mb/s operating digital DLL architecture for 512-Mb DDR SDRAM.T. Hamamoto, K. Furutani, T. Kubo, S. Kawasaki, H. Iga, T. Kono, Y. Konishi, and T. Yoshihara. IEEE J. Solid State Circuits, 39 (1): 194-206 (2004)A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C.T. Shimoi, K. Matsubara, T. Saito, T. Ogawa, Y. Taito, Y. Kaneda, M. Izuna, K. Takeda, H. Mitani, T. Ito and 1 other author(s). VLSI Technology and Circuits, page 134-135. IEEE, (2022)A 24MB Embedded Flash System Based on 28nm SG-MONOS Featuring 240MHz Read Operations and Robust Over-The-Air Software Update for Automotive.A. Kanda, T. Kurafuji, K. Takeda, T. Ogawa, Y. Taito, K. Yoshihara, M. Nakano, T. Ito, H. Kondo, and T. Kono. VLSI Circuits, page 210-. IEEE, (2019)Essential Roles, Challenges and Development of Embedded MCU Micro-Systems to Innovate Edge Computing for the IoT/AI Age.T. Kono, Y. Taito, and H. Hidaka. IEICE Trans. Electron., 103-C (4): 132-143 (2020)A 40nm Embedded SG-MONOS Flash Macro for High-end MCU Achieving 200MHz Random Read Operation and 7.91Mb/mm2 Density with Charge Assisted Offset Cancellation Sense Amplifier.M. Nakano, Y. Kaneda, K. Takeda, T. Shimoi, Y. Aoki, S. Nakanishi, Y. Tashiro, Y. Taito, K. Matsubara, M. Nakagawa and 5 other author(s). A-SSCC, page 1-3. IEEE, (2021)40-nm Embedded Split-Gate MONOS (SG-MONOS) Flash Macros for Automotive With 160-MHz Random Access for Code and Endurance Over 10 M Cycles for Data at the Junction Temperature of 170°C.T. Kono, T. Ito, T. Tsuruda, T. Nishiyama, T. Nagasawa, T. Ogawa, Y. Kawashima, H. Hidaka, and T. Yamauchi. IEEE J. Solid State Circuits, 49 (1): 154-166 (2014)40nm embedded SG-MONOS flash macros for automotive with 160MHz random access for code and endurance over 10M cycles for data.T. Kono, T. Ito, T. Tsuruda, T. Nishiyama, T. Nagasawa, T. Ogawa, Y. Kawashima, H. Hidaka, and T. Yamauchi. ISSCC, page 212-213. IEEE, (2013)

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Disambiguation of "Kono, Takashi"