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Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , and . Microprocess. Microsystems, (2017)Assessing the Reliability of Successive Approximate Computing Algorithms under Fault Injection., , , , and . J. Electron. Test., 35 (3): 367-381 (2019)Towards approximation during test of Integrated Circuits., , , , , and . DDECS, page 28-33. IEEE, (2017)Synthesis of Finite State Machines on Memristor Crossbars., , , , , and . DDECS, page 107-112. IEEE, (2018)Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks., , , , , , , and . IEEE Trans. Emerg. Top. Comput., 10 (4): 1867-1882 (2022)March Test Generation Revealed., , , , and . IEEE Trans. Computers, 57 (12): 1704-1713 (2008)Multi-Objective Application-Driven Approximate Design Method., , , and . IEEE Access, (2021)