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Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices., , , and . DELTA, page 216-221. IEEE Computer Society, (2008)Making ATE Accessible for Academic Institutions., and . DELTA, page 219-222. IEEE Computer Society, (2002)Guest Editorial Special Issue on IMTC'04., and . IEEE Trans. Instrumentation and Measurement, 54 (4): 1346 (2005)Hough Transform Run Length Encoding for Real-Time Image Processing., , and . IEEE Trans. Instrumentation and Measurement, 56 (3): 962-967 (2007)March PS(23N) Test for DRAM Pattern-Sensitive Faults., , and . Asian Test Symposium, page 354-. IEEE Computer Society, (1998)On-Line Testing In Digital Neural Networks., and . Asian Test Symposium, page 295-. IEEE Computer Society, (1996)Smart Wall: Passive Visible Light Positioning with Ambient Light Only., , , and . I2MTC, page 1-6. IEEE, (2019)BIST Module for Mixed-Signal Circuits., , , and . DFT, page 349-. IEEE Computer Society, (1998)Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis., , , and . IEEE Des. Test Comput., 23 (2): 88-98 (2006)Data-Driven Condition-Based Maintenance of Test Handlers in Semiconductor Manufacturing., , , , , and . DELTA, page 189-194. IEEE Computer Society, (2011)