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Low cost at-speed testing using On-Product Clock Generation compatible with test compression., , , , , , , , and . ITC, page 724-733. IEEE Computer Society, (2010)Designing mega-ASICs in nanogate technologies., , and . DAC, page 770-775. ACM, (2003)Efficient Latch and Clock Structures for System-on-Chip Test Flexibility.. ITC, page 1-7. IEEE Computer Society, (2006)An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs., , , , , , , , and . VTS, page 173-178. IEEE Computer Society, (2007)Design methodology for IBM ASIC products., , , , , , , , and . IBM J. Res. Dev., 40 (4): 387-406 (1996)Variation-aware performance verification using at-speed structural test and statistical timing., , , , , , and . ICCAD, page 405-412. IEEE Computer Society, (2007)IBM's 50 Million gate ASICs., , and . ASP-DAC, page 628-634. ACM, (2003)The IBM ASIC/SoC methodology - A recipe for first-time success., and . IBM J. Res. Dev., 46 (6): 649-660 (2002)Applying placement-based synthesis for on-time system-on-a-chip design.. CICC, page 121-124. IEEE, (2000)Managing power and performance for System-on-Chip designs using Voltage Islands., , , , , and . ICCAD, page 195-202. ACM / IEEE Computer Society, (2002)