Author of the publication

Efficient fall detection based on event pattern matching in image streams.

, , and . BigComp, page 51-58. IEEE, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Efficient fall detection based on event pattern matching in image streams., , and . BigComp, page 51-58. IEEE, (2017)Application of condition-based HRA method for a manual actuation of the safety features in a nuclear power Plant., and . Reliab. Eng. Syst. Saf., 91 (6): 627-633 (2006)Development of state-based integrated dependability model of RPS in NPPs considering CCF and periodic testing effects at the early design phase., , , and . Reliab. Eng. Syst. Saf., (2020)Probabilistic risk assessment on maritime spent nuclear fuel transportation - Part I: Transport cask damage probability., and . Reliab. Eng. Syst. Saf., (2017)Study on the systematic approach of Markov modeling for dependability analysis of complex fault-tolerant features with voting logics., , , and . Reliab. Eng. Syst. Saf., (2016)Corrigendum to "Reliability modeling of safety-critical network communication in a digitalized nuclear power plant" Reliab. Eng. Syst. Saf. 144 (2015) 285-295., , , , , and . Reliab. Eng. Syst. Saf., (2016)Input-Domain Software Testing for Failure Probability Estimation of Safety-Critical Applications in Consideration of Past Input Sequence., , , , , and . IEEE Access, (2018)Information theoretic approach to man-machine interface complexity evaluation., and . IEEE Trans. Syst. Man Cybern. Part A, 31 (3): 163-171 (2001)Probabilistic risk assessment on maritime spent nuclear fuel transportation (Part II: Ship collision probability)., and . Reliab. Eng. Syst. Saf., (2017)Motor Health Monitoring at Standstill Through Impedance Analysis., , and . IEEE Trans. Ind. Electron., 63 (7): 4422-4431 (2016)