( en | de | ru )

 

Disambiguation of "Waltl, Michael"

Author of the publication

copydeleteadd this publication to your clipboard
Interplay between hot carrier and bias stress components in single-layer double-gated graphene field-effect transistors.

, , , , , , and . ESSDERC, page 172-175. IEEE, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Gerhard Waltl

Peter Waltl

Hubert Waltl

Josef Waltl

Josef Waltl

 

Other publications of authors with the same name

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors., , , , , , , , , and 2 other author(s). IRPS, page 10. IEEE, (2022)Hot-carrier degradation in single-layer double-gated graphene field-effect transistors., , , , , , , and . IRPS, page 2. IEEE, (2015)Defect Spectroscopy in SiC Devices.. IRPS, page 1-9. IEEE, (2020)Utilizing NBTI for Operation Detection of Integrated Circuits., , and . VDAT, volume 1066 of Communications in Computer and Information Science, page 190-201. Springer, (2019)Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata., , , , and . ETS, page 1-2. IEEE, (2021)Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities., , , , , , and . ESSDERC, page 376-379. IEEE, (2022)Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures., , , , , , , , and . IRPS, page 1-6. IEEE, (2020)Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors., , , , , , , , , and 1 other author(s). IRPS, page 2. IEEE, (2018)Comphy - A compact-physics framework for unified modeling of BTI., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)