( en | de | ru )

 

Disambiguation of "Bernardi, Paolo"

Author of the publication

copydeleteadd this publication to your clipboard
Cumulative embedded memory failure bitmap display & analysis.

, , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Markus Bernardi

Giordano Paolo

Andreas Bernardi

Mirko Bernardi

Jacqueline Bernardi

 

Other publications of authors with the same name

Parallel Multithread Analysis of Extremely Large Simulation Traces., , , , , , and . IEEE Access, (2022)Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis., and . IEEE Trans. Instrum. Meas., 61 (4): 1002-1018 (2012)An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (3): 570-574 (2008)Exploring the Mysteries of System-Level Test., , , , , , , , , and . CoRR, (2021)Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test., , , , and . J. Electron. Test., 30 (3): 317-328 (2014)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , , and . J. Electron. Test., 20 (1): 79-87 (2004)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)