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A built-in current monitor for testing analog circuit blocks.

, and . ISCAS (2), page 109-114. IEEE, (1999)

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Silicon MEMS Oscillators for High-Speed Digital Systems., and . IEEE Micro, 30 (2): 80-89 (2010)Silicon MEMS oscillators for high speed digital systems., and . Hot Chips Symposium, page 1-25. IEEE, (2009)Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?, , , , , , and . VTS, page 175-176. IEEE Computer Society, (2002)Design of a Tunable Differential Ring Oscillator With Short Start-Up and Switching Transients., , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 54-I (12): 2669-2682 (2007)An All-Digital DFT Scheme for Testing Catastrophic Faults in PLLs., , , , and . IEEE Des. Test Comput., 20 (1): 60-67 (2003)A MEMS-Assisted Temperature Sensor With 20-µK Resolution, Conversion Rate of 200 S/s, and FOM of 0.04 pJK2., , , , , , , , , and 5 other author(s). IEEE J. Solid State Circuits, 52 (1): 185-197 (2017)Jitter spectrum analysis using continuous time interval analyzer (CTIA)., , and . ITC, page 10. IEEE Computer Society, (2005)An Embedded Core for Sub-Picosecond Timing Measurements., and . ITC, page 129-137. IEEE Computer Society, (2002)A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices., , , , , and . J. Electron. Test., 21 (6): 621-630 (2005)11.1 Dual-MEMS-resonator temperature-to-digital converter with 40 K resolution and FOM of 0.12pJK2., , , , , , , , , and 4 other author(s). ISSCC, page 200-201. IEEE, (2016)