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Disambiguation of "Lee, Kuen-Jong"

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On Deadlock Problem of On-Chip Buses Supporting Out-of-Order Transactions.

, and . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 484-496 (2014)

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Jong-Kwan Lee

Jong-Ha Lee

Jong Wan Lee

Jong-Soo Lee

Jong-Won Lee

 

Other publications of authors with the same name

Reduction of power consumption in scan-based circuits during testapplication by an input control technique., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 20 (7): 911-917 (2001)Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (5): 754-764 (2012)On-Chip Self-Test Methodology With All Deterministic Compressed Test Patterns Recorded in Scan Chains., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 38 (2): 309-321 (2019)A General Structure of Feedback Shift Registers for Built-In Self Test., , and . J. Inf. Sci. Eng., 14 (3): 645-667 (1998)Concurrent Error Detection, Diagnosis, and Fault Tolerance for Switched-Capacitor Filters., and . J. Inf. Sci. Eng., 14 (4): 863-890 (1998)Efficient LFSR Reseeding Based on Internal-Response Feedback., , , and . J. Electron. Test., 30 (6): 673-685 (2014)An Efficient Procedure to Generate Highly Compact Diagnosis Patterns for Transition Faults., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (3): 737-749 (2022)On Deadlock Problem of On-Chip Buses Supporting Out-of-Order Transactions., and . IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 484-496 (2014)A Repair-for-Diagnosis Methodology for Logic Circuits., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (11): 2254-2267 (2018)A practical current sensing technique for IDDQ testing., , and . IEEE Trans. Very Large Scale Integr. Syst., 3 (2): 302-310 (1995)