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Use of DFT Techniques In Speed Grading a 1GHz+ Microprocessor ., , , , , and . ITC, page 1111-1119. IEEE Computer Society, (2002)Testing clock distribution circuits using an analytic signal method., , , , , and . ITC, page 323-331. IEEE Computer Society, (2001)Very Low Cost Testers: Opportunities and Challenges., , , and . IEEE Des. Test Comput., 18 (5): 60-69 (2001)Functional Verification Methodology for the PowerPC 604 Microprocessor., , and . DAC, page 319-324. ACM Press, (1996)Achieving Zero-Defects for Automotive Applications.. ITC, page 1-10. IEEE Computer Society, (2008)A Wavelet-Based Timing Parameter Extraction Method., , , and . ITC, page 120-128. IEEE Computer Society, (2002)DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor., , , , , , , and . ITC, page 137-146. IEEE Computer Society, (1999)How Seriously Do You Take Your Possible-Detect Faults?, , and . ITC, page 819-828. IEEE Computer Society, (1997)At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor., , , and . VTS, page 3-8. IEEE Computer Society, (2000)Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture., , , , , and . VTS, page 3-8. IEEE Computer Society, (2002)