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Innovative practices session 3C hardware security., , and . VTS, page 1. IEEE Computer Society, (2017)Tester-based optical and electrical diagnostic system and techniques., and . VTS, page 209-214. IEEE Computer Society, (2012)Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip., , , , , and . ITC, page 717-726. IEEE Computer Society, (1998)Root cause identification of an hard-to-find on-chip power supply coupling fail., , , , , , and . ITC, page 1-7. IEEE Computer Society, (2012)Counterfeit IC detection using light emission., , and . ITC, page 1-8. IEEE Computer Society, (2014)On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)., , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Characterization of a 0.13 mum CMOS Link Chip using Time Resolved Emission (TRE)., , , , , , and . Microelectron. Reliab., 45 (9-11): 1550-1553 (2005)Latchup Analysis Using Emission Microscopy., , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1663-1668 (2003)Delay chain based programmable jitter generator., , , and . European Test Symposium, page 16-21. IEEE Computer Society, (2004)