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Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture.

, , and . DAC, page 31:1-31:6. ACM, (2016)

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Predicting electromigration mortality under temperature and product lifetime specifications., and . DAC, page 43:1-43:6. ACM, (2016)American sign language recognition using HAAR type classifier., , , and . KES Journal, 19 (1): 63-68 (2015)Probabilistic Wire Resistance Degradation Due to Electromigration in Power Grids., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (4): 628-640 (2017)Investigation for Performance Measures of Wireless Power Transfer (WPT) using MATLAB., and . Int. J. Perform. Eng., 18 (3): 201 (2022)Ensemble Differential Evolution with Simulation-Based Hybridization and Self-Adaptation for Inventory Management Under Uncertainty., , and . CoRR, (2023)Bio inspired source seeking: a Hybrid Speeding Up and Slowing Down Algorithm., , and . CDC, page 4334-4339. IEEE, (2016)A stochastic optimization framework for source seeking with infotaxis-like algorithms., and . CDC, page 6845-6850. IEEE, (2016)Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture., , and . DAC, page 31:1-31:6. ACM, (2016)Circuit delay variability due to wire resistance evolution under AC electromigration., and . IRPS, page 3. IEEE, (2015)A systematic approach for analyzing and optimizing cell-internal signal electromigration., , , , and . ICCAD, page 486-491. IEEE, (2014)