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Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling.

, , and . VTS, page 261-266. IEEE Computer Society, (1997)

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Specification-driven test generation for analog circuits., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (10): 1189-1201 (2000)Test Generation for Analog Circuits Using Partial Numerical Simulation., , and . VLSI Design, page 597-602. IEEE Computer Society, (1999)Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling., and . IEEE Des. Test Comput., 17 (3): 106-115 (2000)Specification-Driven Test Design for Analog Circuits., and . DFT, page 335-340. IEEE Computer Society, (1998)Increasing the IDDQ test resolution using current prediction.. ITC, page 217-224. IEEE Computer Society, (2000)Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices., , , and . J. Electron. Test., 26 (4): 405-417 (2010)DIBPro: Automatic Diagnostic Program Generation Tool., , , and . ITC, page 1-8. IEEE Computer Society, (2006)Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers., , , , , , and . ETS, page 68-73. IEEE Computer Society, (2005)Measuring Stray Capacitance on Tester Hardware., , , and . VTS, page 351-356. IEEE Computer Society, (2002)Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements., and . VTS, page 132-137. IEEE Computer Society, (1998)