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Performance Measurement in Blind Audio Source Separation, , and . IEEE Transactions on Speech and Audio Processing, (2006)Spin-glass dynamics : Relation between theory and experiment: a beginning, , , , and . Physica A: Statistical and Theoretical Physics, 185 (1-4): 278--294 (Jun 15, 1992)Performance & reliability of 3D architectures (πfet, Finfet, Ωfet)., , , , , , , , , and . IRPS, page 6. IEEE, (2018)Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions., , , , , and . Microelectron. Reliab., 41 (9-10): 1295-1300 (2001)Guest Editorial., and . Microelectron. Reliab., 43 (8): 1173 (2003)A thorough investigation of MOSFETs NBTI degradation., , , , , , and . Microelectron. Reliab., 45 (1): 83-98 (2005)Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies., , , , and . Microelectron. Reliab., 43 (8): 1241-1246 (2003)Hole injection enhanced hot-carrier degradation in PMOSFETs used for systems on chip applications with 6.5-2 nm thick gate-oxides., , , and . Microelectron. Reliab., 44 (1): 65-77 (2004)Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement., , , and . Microelectron. Reliab., 42 (9-11): 1497-1500 (2002)Characterization and modeling of dynamic variability induced by BTI in nano-scaled transistors., , , , , and . Microelectron. Reliab., (2018)