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Physical and electrical characterization of Mg-doped ZnO thin-film transistors.

A. Shaw, T. Whittles, I. Mitrovic, J. Jin, J. Wrench, D. Hesp, V. Dhanak, P. Chalker, and S. Hall. ESSDERC, page 206-209. IEEE, (2015)

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Veselin Mitrovic

Nenad Mitrovic

Ivona Jakovljevi

Sascha Mitrovic

Veselin Mitrovic

Other publications of authors with the same name

Facile Route for Low-temperature Eco-friendly Solution Processed ZnSnO Thin-film Transistors.T. Zhao, C. Zhao, I. Mitrovic, E. Lim, L. Yang, C. Qiu, and C. Zhao. IRPS, page 1-4. IEEE, (2020)Effect of High-k Passivation Layer on High Voltage Properties of GaN Metal-Insulator-Semiconductor Devices.Y. Cai, Y. Wang, Y. Liang, Y. Zhang, W. Liu, H. Wen, I. Mitrovic, and C. Zhao. IEEE Access, (2020)Emerging Optical In-Memory Computing Sensor Synapses Based on Low-Dimensional Nanomaterials for Neuromorphic Networks.Z. Shen, C. Zhao, L. Kang, Y. Sun, Y. Liu, I. Mitrovic, L. Yang, E. Lim, Z. Zeng, and C. Zhao. Adv. Intell. Syst., (2022)Solution-processed Synaptic Transistors Utilizing MXenes as Floating Gate.T. Zhao, C. Zhao, Y. Liu, L. Yang, I. Mitrovic, E. Lim, and C. Zhao. ICICDT, page 1-4. IEEE, (2021)Water-induced Combustion-processed Metal-oxide Synaptic Transistor.Q. Liu, C. Zhao, Y. Liu, I. Mitrovic, W. Xu, L. Yang, Z. Wang, W. Wei, Y. Wu, and X. Yu. ICICDT, page 1-4. IEEE, (2021)Resistive switching performance of memristor with solution-processed stacked MO/2D-materials switching layers.Z. Shen, C. Zhao, I. Mitrovic, C. Zhao, Y. Liu, and L. Yang. ICICDT, page 1-4. IEEE, (2021)Electrical and structural properties of hafnium silicate thin films.I. Mitrovic, O. Buiu, S. Hall, C. Bungey, T. Wagner, W. Davey, and Y. Lu. Microelectron. Reliab., 47 (4-5): 645-648 (2007)Towards rectennas for solar energy harvesting.N. Sedghi, J. Zhang, J. Ralph, Y. Huang, I. Mitrovic, and S. Hall. ESSDERC, page 131-134. IEEE, (2013)Characteristics of Ni/AlOx/Pt RRAM devices with various dielectric fabrication temperatures.Z. Shen, C. Zhao, C. Zhao, I. Mitrovic, L. Yang, W. Xu, E. Lim, T. Luo, and Y. Huang. ICICDT, page 1-4. IEEE, (2019)Effect of High-k Passivation Layer on Electrical Properties of GaN Metal-Insulator-Semiconductor Devices.Y. Cai, Y. Wang, M. Cui, W. Liu, H. Wen, C. Zhao, I. Mitrovic, S. Taylor, and P. Chalker. ICICDT, page 1-5. IEEE, (2019)

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Disambiguation of "Mitrovic, Ivona Z."

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Physical and electrical characterization of Mg-doped ZnO thin-film transistors.

Please choose a person to relate this publication to

Veselin Mitrovic

Nenad Mitrovic

Ivona Jakovljevi

Sascha Mitrovic

Veselin Mitrovic

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Mitrovic, Ivona Z."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Physical and electrical characterization of Mg-doped ZnO thin-film transistors.

Please choose a person to relate this publication to

Veselin Mitrovic

Nenad Mitrovic

Ivona Jakovljevi

Sascha Mitrovic

Veselin Mitrovic

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Physical and electrical characterization of Mg-doped ZnO thin-film transistors.