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An oscillation-based test structure for timing information extraction., , , and . VTS, page 74-79. IEEE Computer Society, (2012)Big data and test.. ITC, page 1. IEEE Computer Society, (2014)Invited paper: Yin and Yang of embedded sensors for post-scaling-era.. VTS, page 324-327. IEEE Computer Society, (2011)5.5GHz system z microprocessor and multi-chip module., , , , , , , , , and 13 other author(s). ISSCC, page 46-47. IEEE, (2013)Data Analysis Techniques for CMOS Technology Characterization and Product Impact Assessment., , and . ITC, page 1-10. IEEE Computer Society, (2006)Video-Text Compliance: Activity Verification Based on Natural Language Instructions., , , , , , , , , and 3 other author(s). ICCV Workshops, page 1503-1512. IEEE, (2019)Using test data to improve IC quality and yield.. ICCAD, page 771-777. IEEE Computer Society, (2008)Guest Editor's Introduction: Getting More Out of Test.. IEEE Des. Test Comput., 24 (5): 474-475 (2007)The 12-Core POWER8™ Processor With 7.6 Tb/s IO Bandwidth, Integrated Voltage Regulation, and Resonant Clocking., , , , , , , , , and 20 other author(s). IEEE J. Solid State Circuits, 50 (1): 10-23 (2015)System-level impact of chip-level failure mechanisms and screens.. ICCAD, page 173-176. IEEE, (2010)