( en | de | ru )

 

Disambiguation of "Kaminska, Bozena"

Author of the publication

copydeleteadd this publication to your clipboard
Multifrequency Analysis of Faults in Analog Circuits.

, and . IEEE Des. Test Comput., 12 (2): 70-80 (1995)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Monika Kaminska

Bozena Kilarski

Bozena Kilarski

Bozena Kilarski

Bozena Scheuble

 

Other publications of authors with the same name

A Deterministic Built-In-Self-Test Generator Based on Cellular Automata Structures., and . IEEE Trans. Computers, 44 (6): 805-816 (1995)Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop., , and . VLSI Design, (2008)Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits., , and . EDAC-ETC-EUROASIC, page 658. IEEE Computer Society, (1994)Initiability: A Measure of Sequential Testability., , and . ISCAS, page 1619-1622. IEEE, (1993)Testing Real-Time Properties of Embedded Systems., and . ESA, page 179-185. CSREA Press, (2008)Evaluation of a Novel Integrated Sensor System for Synchronous Measurement of Cardiac Vibrations and Cardiac Potentials., , and . J. Medical Systems, 35 (4): 445-455 (2011)Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (3): 332-345 (1999)A new dynamic test vector compaction for automatic test pattern generation., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (3): 353-358 (1994)FPAD: a fuzzy nonlinear programming approach to analog circuit design., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (7): 785-793 (1995)Conference Reports., , , , , , and . IEEE Des. Test Comput., 12 (4): 95-97 (1995)