( en | de | ru )

 

Disambiguation of "Homouz, Dirar"

Author of the publication

copydeleteadd this publication to your clipboard
Physics model of memristor devices with varying active materials.

, , , , and . ISCAS, page 1590-1593. IEEE, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Homouz, Dirar
add a person with the name Homouz, Dirar
 

Other publications of authors with the same name

Kernel ridge regression using truncated newton method., and . Knowl. Based Syst., (2014)Accurate Prediction of Gas Compressibility Factor using Kernel Ridge Regression., , , and . ACTEA, page 1-4. IEEE, (2019)Modeling and Optimization of Memristor and STT-RAM-Based Memory for Low-Power Applications., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (3): 1003-1014 (2016)Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects., , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 63-I (12): 2139-2148 (2016)Logistic regression in large rare events and imbalanced data: A performance comparison of prior correction and weighting methods., , and . Comput. Intell., 34 (1): 161-174 (2018)Robust Hybrid Memristor-CMOS Memory: Modeling and Design., , and . IEEE Trans. Very Large Scale Integr. Syst., 21 (11): 2069-2079 (2013)Analyzing a co-occurrence gene-interaction network to identify disease-gene association., , , , and . BMC Bioinform., 20 (1): 70:1-70:15 (2019)Physics model of memristor devices with varying active materials., , , , and . ISCAS, page 1590-1593. IEEE, (2016)Embedded memory design using memristor: Retention time versus write energy., , , , and . ICECS, page 41-44. IEEE, (2013)Effect of device, size, activation energy, temperature, and frequency on memristor switching time., , and . ICM, page 60-63. IEEE, (2014)