( en | de | ru )

 

Disambiguation of "Lee, S."

Author of the publication

copydeleteadd this publication to your clipboard
Crystallization Kinetics of Lead Halide Perovskite Film Monitored by In Situ Terahertz Spectroscopy

, , , , , and . The Journal of Physical Chemistry Letters, 8 (2): 401-406 (2017)PMID: 28050908.
DOI: 10.1021/acs.jpclett.6b02691

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Simon S Lee

Xavier Lee Lee

S Fröhlich

S Ulrich

S Bachmann

 

Other publications of authors with the same name

Study on listmode OSEM reconstruction including image-space resolution recovery techniques for compton camera., , , , , , , and . ISBI, page 796-799. IEEE, (2010)The Physics of the B Factories, , , , , , , , , and 2024 other author(s). The European Physical Journal C, (Jul 8, 2014)Search for a light pseudoscalar Higgs boson in the dimuon decay channel in pp collisions at √s = 7 TeV, , , , , , , , , and 2183 other author(s). Phys Rev Lett, 109 (12): 121801-121801 (September 2012)Reliability Characterization of HBM featuring $HK+MG$ Logic Chip with Multi-stacked DRAMs., , , , , , , , and . IRPS, page 1-7. IEEE, (2023)Front-side and Back-side Power Delivery Network Guidelines for 2nm node High Perf Computing and Mobile SoC applications., , , , , , , , , and . VLSI Technology and Circuits, page 1-2. IEEE, (2023)Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology., , , , , , , , and . IRPS, page 6. IEEE, (2022)4.1 A 39GHz-Band CMOS 16-Channel Phased-Array Transceiver IC with a Companion Dual-Stream IF Transceiver IC for 5G NR Base-Station Applications., , , , , , , , , and 23 other author(s). ISSCC, page 76-78. IEEE, (2020)Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology., , , , , , , , , and 13 other author(s). IRPS, page 1-3. IEEE, (2019)Development and Product Reliability Characterization of Advanced High Speed 14nm DDR5 DRAM with On-die ECC., , , , , , , , and . IRPS, page 1-4. IEEE, (2023)Search for low-mass dark matter with CsI(Tl) crystal detectors, , , , , , , , , and 21 other author(s). Phys. Rev. D, 90 (5): 052006 (September 2014)