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Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies.

, , , , , and . Microelectron. Reliab., 51 (9-11): 1508-1514 (2011)

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Color set selection for nominal coding by Hopfield networks., , and . Vis. Comput., 11 (3): 150-155 (1995)28nm UTBB FDSOI product reliability/performance trade-off optimization through body bias operation., , , , and . IRPS, page 6. IEEE, (2015)Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies., , , , , and . Microelectron. Reliab., 51 (9-11): 1508-1514 (2011)Using Hopfield networks in the nominal color coding of classified images., , and . ICPR (2), page 112-116. IEEE, (1994)Physical understanding of low frequency degradation of NMOS TDDB in High-k metal gate stack-based technology. Implication on lifetime assessment., , , , , , , and . IRPS, page 5. IEEE, (2015)A Knowledge Based Information System for Managing Research Programs and Value Creation in a University Environment., , , and . AMCIS, page 357. Association for Information Systems, (2005)A Knowledge-Based Entrepreneurial Approach for Business Intelligence in Strategic Technologies: Bio-Mems., , , , , and . AMCIS, page 29. Association for Information Systems, (2005)The Physics of the B Factories, , , , , , , , , and 2024 other author(s). The European Physical Journal C, (Jul 8, 2014)TESLA Technical Design Report Part III: Physics at an e+e- Linear Collider, , , , , , , , , and 230 other author(s). (Jun 28, 2001)Geant4—a simulation toolkit, , , , , , , , , and 117 other author(s). Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 506 (3): 250 - 303 (2003)