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A Built-Off Self-Repair Scheme for Channel-Based 3D Memories.

H. Liu, B. Lin, C. Wu, W. Chiang, M. Lee, H. Lin, C. Peng, and M. Wang. IEEE Trans. Computers, 66 (8): 1293-1301 (2017)

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Min Wang

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A 500MHz Random-Access Embedded 1Mb DRAM Macro in Bulk CMOS.S. Romanovsky, A. Katoch, A. Achyuthan, C. O'Connell, S. Natarajan, C. Huang, C. Wu, M. Wang, C. Wang, P. Chen and 1 other author(s). ISSCC, page 270-271. IEEE, (2008)A HKMG 28nm 1GHz fully-pipelined tile-able 1MB embedded SRAM IP with 1.39mm2 per MB.M. Kuo, O. Takahashi, P. Yang, C. Lin, M. Wang, P. Wang, and S. Dhong. CICC, page 1-4. IEEE, (2013)A 1 Tbit/s Bandwidth 1024 b PLL/DLL-Less eDRAM PHY Using 0.3 V 0.105 mW/Gbps Low-Swing IO for CoWoS Application.M. Lin, C. Tsai, C. Chang, W. Huang, Y. Hsu, S. Yang, C. Fu, M. Chou, T. Huang, C. Chen and 5 other author(s). IEEE J. Solid State Circuits, 49 (4): 1063-1074 (2014)On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs.C. Chi, B. Lin, C. Wu, M. Wang, H. Lin, and C. Peng. IEEE Des. Test, 31 (4): 16-26 (2014)A memory yield improvement scheme combining built-in self-repair and error correction codes.T. Wu, P. Chen, M. Lee, B. Lin, C. Wu, C. Tien, H. Lin, H. Chen, C. Peng, and M. Wang. ITC, page 1-9. IEEE Computer Society, (2012)High Quality Test Methodology for Highly Reliable Devices.H. Chen, M. Lee, L. Chen, and M. Wang. ITC, page 1-6. IEEE, (2019)Site-aware Anomaly Detection with Machine Learning for Circuit Probing to Prevent Overkill.M. Lee, C. Lu, C. Tsai, H. Chen, and M. Wang. ITC-Asia, page 1-6. IEEE, (2020)3D-IC interconnect test, diagnosis, and repair.C. Chi, C. Wu, M. Wang, and H. Lin. VTS, page 1-6. IEEE Computer Society, (2013)Custom 6-R, 2- or 4-W multi-port register files in an ASIC SOC with a DVFS window of 0.5 V, 130 MHz to 0.96 V, 3.2 GHz in a 28-nm HKMG CMOS technology.H. Hsieh, S. Dhong, C. Lin, M. Kuo, K. Tseng, P. Yang, K. Huang, M. Wang, and W. Hwang. CICC, page 1-3. IEEE, (2015)Testing-for-manufacturing (TFM) for ultra-thin IPD on InFO.T. Chiu, Y. Tseng, Y. Lin, Y. Wang, H. Lin, and M. Wang. ITC-Asia, page 90-95. IEEE, (2017)

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Disambiguation of "Wang, Min-Jer"

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A Built-Off Self-Repair Scheme for Channel-Based 3D Memories.

Please choose a person to relate this publication to

Min Wang

Min Wang

Min Wang

Min Wang

Min Wang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wang, Min-Jer"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A Built-Off Self-Repair Scheme for Channel-Based 3D Memories.

Please choose a person to relate this publication to

Min Wang

Min Wang

Min Wang

Min Wang

Min Wang

Other publications of authors with the same name

Disambiguation

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URL
DOI
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Chicago
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A Built-Off Self-Repair Scheme for Channel-Based 3D Memories.