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Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification.

, , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (9): 1545-1556 (2017)

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A methodology for fast and accurate yield factor estimation during global routing., and . ICCAD, page 481-487. IEEE Computer Society, (2007)Accurate detection for process-hotspots with vias and incomplete specification., , and . ICCAD, page 839-846. IEEE Computer Society, (2007)A Hierarchy-Based Distributed Algorithm for Layout Geometry Operations., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (10): 1546-1557 (2012)Model Based Layout Pattern Dependent Metal Filling Algorithm for Improved Chip Surface Uniformity in the Copper Process., , and . ASP-DAC, page 1-6. IEEE Computer Society, (2007)Efficient process-hotspot detection using range pattern matching., , , , and . ICCAD, page 625-632. ACM, (2006)The road to 3D EDA tool readiness., and . ASP-DAC, page 429-436. IEEE, (2009)Improved tangent space based distance metric for accurate lithographic hotspot classification., , , , and . DAC, page 1173-1178. ACM, (2012)Graph Coloring Problem Solution Using Modified Flocking Algorithm., and . SocProS (2), volume 259 of Advances in Intelligent Systems and Computing, page 113-123. Springer, (2013)Fast and scalable parallel layout decomposition in double patterning lithography., , , , and . Integr., 47 (2): 175-183 (2014)Efficient range pattern matching algorithm for process-hotspot detection., , , , , and . IET Circuits Devices Syst., 2 (1): 2-15 (2008)