( en | de | ru )

 

Disambiguation of "Bernardi, Paolo"

Author of the publication

copydeleteadd this publication to your clipboard
Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study.

, , , , , and . ISVLSI, page 731-736. IEEE Computer Society, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Markus Bernardi

Giordano Paolo

Andreas Bernardi

Mirko Bernardi

Mariangela Bernardi

 

Other publications of authors with the same name

Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)Parallel Multithread Analysis of Extremely Large Simulation Traces., , , , , , and . IEEE Access, (2022)An Adaptive Low-Cost Tester Architecture Supporting Embedded Memory Volume Diagnosis., and . IEEE Trans. Instrum. Meas., 61 (4): 1002-1018 (2012)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)Exploring the Mysteries of System-Level Test., , , , , , , , , and . CoRR, (2021)An Effective Technique for the Automatic Generation of Diagnosis-Oriented Programs for Processor Cores., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (3): 570-574 (2008)Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test., , , , and . J. Electron. Test., 30 (3): 317-328 (2014)A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques., , , , , , and . J. Electron. Test., 20 (1): 79-87 (2004)An Optimized Test During Burn-In for Automotive SoC., , , , , , , and . IEEE Des. Test, 35 (3): 46-53 (2018)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , and . VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 130-151. Springer, (2016)