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Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects.

, , , , , and . J. Low Power Electron., 13 (1): 135-147 (2017)

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Online monitoring of NBTI and HCD in beta-multiplier circuits., , , , and . IOLTS, page 209-210. IEEE, (2016)Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects., , , , , and . J. Low Power Electron., 13 (1): 135-147 (2017)Reliability-Aware Multi-Vth Domain Digital Design Assessment., , , and . DDECS, page 1-4. IEEE, (2018)Design for reliability of generic sensor interface circuits., , , , , and . Microelectron. Reliab., (2018)Reliability-aware design method for CMOS circuits., , , and . ERMAVSS@DATE, volume 1566 of CEUR Workshop Proceedings, page 17-20. CEUR-WS.org, (2016)Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability., , , and . SMACD, page 65-68. IEEE, (2018)On-line monitoring and error correction in sensor interface circuits using digital calibration techniques., , , , and . VTS, page 1-6. IEEE Computer Society, (2018)Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process., , , , and . MIXDES, page 353-358. IEEE, (2016)Behavioral modeling of a sensor interface circuit including various non-idealities., , , , and . SMACD, page 1-4. IEEE, (2017)Parameter identification for behavioral modeling of analog components including degradation., , , , and . MIXDES, page 336-340. IEEE, (2016)