( en | de | ru )

 

Disambiguation of "Biswas, Sounil"

Author of the publication

copydeleteadd this publication to your clipboard
Statistical Test Compaction Using Binary Decision Trees.

, and . IEEE Des. Test Comput., 23 (6): 452-462 (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Atish Biswas

Biplab Biswas

Koushik Biswas

Kajal Biswas

Sonia Biswas

 

Other publications of authors with the same name

A Path Sensitization Technique for Testing of Switched Capacitor Circuits., and . VLSI Design, page 30-35. IEEE Computer Society, (2003)Generalized Sensitization using Fault Tuples., , and . VTS, page 297-303. IEEE Computer Society, (2004)SERDES external loopback test using production parametric-test hardware., , , and . ITC, page 1-7. IEEE, (2016)Reducing test cost of integrated, heterogeneous systems using pass-fail test data analysis., , and . ACM Trans. Design Autom. Electr. Syst., 19 (2): 20:1-20:23 (2014)Specification Test Compaction for Analog Circuits and MEMS, , , and . CoRR, (2007)Reducing Test Execution Cost of Integrated, Heterogeneous Systems Using Continuous Test Data., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (1): 148-158 (2011)Statistical Test Compaction Using Binary Decision Trees., and . IEEE Des. Test Comput., 23 (6): 452-462 (2006)Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data., and . VTS, page 299-308. IEEE Computer Society, (2008)Innovative practices session 5C: Machine learning and data analysis in test., , , and . VTS, page 1. IEEE Computer Society, (2014)An Industrial Study of System-Level Test., and . IEEE Des. Test Comput., 29 (1): 19-27 (2012)