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Fault Detection in Sequential Circuits through Functional Testing., , and . DFT, page 191-198. IEEE Computer Society, (1993)A CMOS Fault Tolerant Architecture for Swith-Level Faults., , , and . DFT, page 10-18. IEEE Computer Society, (1994)Factors affecting ERP system adoption: A comparative analysis between SMEs and large companies., , , , , and . J. Enterp. Inf. Manag., 18 (4): 384-426 (2005)A new switching-level approach to multiple-output functions synthesis., , , and . VLSI Design, page 125-129. IEEE Computer Society, (1995)Using Critical Success Factors for Assessing Critical Activities in ERP Implementation within SMEs., , and . ICEIS (1), page 285-292. (2005)State assignment and testability of PLA-based finite state machines., and . Microprocess. Microprogramming, 35 (1-5): 391-398 (1992)Optimization techniques for multiple output function synthesis., , and . EURO-DAC, page 545-551. EEE Computer Society, (1991)Data Path Testability Analysis Based on BDDs., , and . ISCAS, page 2012-2014. IEEE, (1995)An approach to a design for testability personal consultant., , , and . Microprocessing and Microprogramming, 30 (1-5): 405-412 (1990)A high-level synthesis approach to design of fault-tolerant systems., , and . VTS, page 356-363. IEEE Computer Society, (1997)