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Alleviating DFT Cost Using Testability Driven HLS.

, , and . Asian Test Symposium, page 46-51. IEEE Computer Society, (1998)

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Are advanced DfT structures sufficient for preventing scan-attacks?, , , and . VTS, page 246-251. IEEE Computer Society, (2012)A smart test controller for scan chains in secure circuits., , , and . IOLTS, page 228-229. IEEE, (2013)A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis., , and . J. Electron. Test., 17 (3-4): 331-339 (2001)SI ECCS: SECure context saving for IoT devices., , , , , and . DTIS, page 1-2. IEEE, (2018)Providing Confidentiality and Integrity in Ultra Low Power IoT Devices., , , , , and . DTIS, page 1-6. IEEE, (2019)Encryption of test data: which cipher is better?, , , , , and . PRIME, page 85-88. IEEE, (2018)Automatic Synthesis of BISTed Data Paths From High Level Specification., , and . EDAC-ETC-EUROASIC, page 591-598. IEEE Computer Society, (1994)A 3D IC BIST for pre-bond test of TSVs using ring oscillators., , , , and . NEWCAS, page 1-4. IEEE, (2013)A Comprehensive Approach to a Trusted Test Infrastructure., , , , , , , , , and 1 other author(s). IVSW, page 43-48. IEEE, (2019)Laser-induced fault effects in security-dedicated circuits., , , , , , , , , and 9 other author(s). VLSI-SoC, page 1-6. IEEE, (2014)