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High-Density 4T SRAM Bitcell in 14-nm 3-D CoolCube Technology Exploiting Assist Techniques.

R. Boumchedda, J. Noel, B. Giraud, K. Akyel, M. Brocard, D. Turgis, and E. Beigné. IEEE Trans. Very Large Scale Integr. Syst., 25 (8): 2296-2306 (2017)

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Edith Wermter

Edith Schulz

Edith Schwarz

Edith Schneider

Edith Fries

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Timing slack monitoring under process and environmental variations: Application to a DSP performance optimization.B. Rebaud, M. Belleville, E. Beigné, C. Bernard, M. Robert, P. Maurine, and N. Azémard. Microelectron. J., 42 (5): 718-732 (2011)On-line Power Optimization of Data Flow Multi-Core Architecture Based on Vdd-Hopping for Local Dynamic Voltage and Frequency Scaling.P. Vivet, E. Beigné, H. Lebreton, and N. Zergainoh. J. Low Power Electron., 7 (2): 265-273 (2011)Dynamic Variability Monitoring Using Statistical Tests for Energy Efficient Adaptive Architectures.L. Vincent, E. Beigné, S. Lesecq, J. Mottin, D. Coriat, and P. Maurine. IEEE Trans. Circuits Syst. I Regul. Pap., 61-I (6): 1741-1754 (2014)An Asynchronous Power Aware and Adaptive NoC Based Circuit.E. Beigné, F. Clermidy, H. Lhermet, S. Miermont, Y. Thonnart, X. Tran, A. Valentian, D. Varreau, P. Vivet, X. Popon and 1 other author(s). IEEE J. Solid State Circuits, 44 (4): 1167-1177 (2009)Fine grain multi-VT co-integration methodology in UTBB FD-SOI technology.B. Pelloux-Prayer, A. Valentian, B. Giraud, Y. Thonnart, J. Noel, P. Flatresse, and E. Beigné. VLSI-SoC, page 168-173. IEEE, (2013)Event-driven asynchronous voltage monitoring in energy harvesting platforms.J. Christmann, E. Beigné, C. Condemine, and C. Piguet. NEWCAS, page 457-460. IEEE, (2012)Session 18 overview: Adaptive circuits and digital regulators: Digital circuit techniques subcommittee.D. Sylvester, K. Hirairi, and E. Beigné. ISSCC, page 298-299. IEEE, (2018)An On-Chip Multi-mode Buck DC-DC Converter for Fine-Grain DVS on a Multi-power Domain SoC Using a 65-nm Standard CMOS Logic Process.M. Ichihashi, H. Lhermet, E. Beigné, F. Rothan, M. Belleville, and A. Amara. PATMOS, volume 5953 of Lecture Notes in Computer Science, page 336-346. Springer, (2009)Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications.T. Wu, D. Kim, D. Morris, and E. Beigné. SiPS, page 1-3. IEEE, (2021)A fully integrated power supply unit for fine grain power management application to embedded Low Voltage SRAMs.E. Beigné, F. Clermidy, S. Miermont, A. Valentian, P. Vivet, S. Barasinski, F. Blisson, N. Kohli, and S. Kumar. ESSCIRC, page 138-141. IEEE, (2008)

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Disambiguation of "Beigné, Edith"

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High-Density 4T SRAM Bitcell in 14-nm 3-D CoolCube Technology Exploiting Assist Techniques.

Please choose a person to relate this publication to

Edith Wermter

Edith Schulz

Edith Schwarz

Edith Schneider

Edith Fries

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Beigné, Edith"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML High-Density 4T SRAM Bitcell in 14-nm 3-D CoolCube Technology Exploiting Assist Techniques.

Please choose a person to relate this publication to

Edith Wermter

Edith Schulz

Edith Schwarz

Edith Schneider

Edith Fries

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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High-Density 4T SRAM Bitcell in 14-nm 3-D CoolCube Technology Exploiting Assist Techniques.