Author of the publication

Testing of a microanalysis system.

. IEEE Trans. Instrumentation and Measurement, 50 (6): 1485-1489 (2001)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A performance analysis tool for performance-driven micro-cell generation., , , and . EURO-DAC, page 576-580. EEE Computer Society, (1991)IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time., , and . LATS, page 1-6. IEEE, (2019)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , and . DATE, page 115-120. IEEE, (2017)Applying IJTAG-compatible embedded instruments for lifetime enhancement of analog front-ends of cyber-physical systems., , , , and . VLSI-SoC, page 1-6. IEEE, (2017)Investigation of Intermittent Resistive Faults in Digital CMOS Circuits., and . Journal of Circuits, Systems, and Computers, 25 (3): 1640023:1-1640023:17 (2016)Rapid transient fault insertion in large digital systems., and . Microprocess. Microsystems, 37 (2): 147-154 (2013)Design for Delay Testability in High-Speed Digital ICs., , , and . J. Electron. Test., 17 (3-4): 225-231 (2001)Configurations for IDDQ-Testable PLAs., and . IEEE Des. Test Comput., 16 (2): 58-65 (1999)Online digital offset voltage compensation method for AMR sensors., and . I2MTC, page 1512-1515. IEEE, (2015)Block-level bayesian diagnosis of analogue electronic circuits., , , and . DATE, page 1767-1772. IEEE Computer Society, (2010)