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Performance and Energy Studies on NC-FinFET Cache-Based Systems With FN-McPAT., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 31 (9): 1280-1293 (September 2023)NCFET to Rescue Technology Scaling: Opportunities and Challenges., , , , and . ASP-DAC, page 637-644. IEEE, (2020)Modeling the Interdependences Between Voltage Fluctuation and BTI Aging., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (7): 1652-1665 (2019)Massively Parallel Circuit Setup in GPU-SPICE., , , and . IEEE Trans. Computers, 72 (8): 2127-2138 (August 2023)On the Workload Dependence of Self-Heating in FinFET Circuits., , , and . IEEE Trans. Circuits Syst. II Express Briefs, 67-II (10): 1949-1953 (2020)Special Session: Machine Learning for Semiconductor Test and Reliability., , , , , , , , , and . VTS, page 1-11. IEEE, (2021)Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , and . IOLTS, page 68-71. IEEE, (2019)Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient., , , , and . IEEE Access, (2021)FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 30 (3): 339-352 (2022)Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths., , , , , and . IRPS, page 1-6. IEEE, (2023)