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A fast and Effective DFT for test and diagnosis of power switches in SoCs., , , , and . DATE, page 1089-1092. EDA Consortium San Jose, CA, USA / ACM DL, (2013)A new fast heuristic for labeling points., , , and . Inf. Process. Lett., 109 (10): 478-484 (2009)Fast FPGA Placement using Space-filling Curve., , , , and . FPL, page 415-420. IEEE, (2005)Lifetime Reliability-Aware Checkpointing Mechanism: Modelling and Analysis., , , , and . ISED, page 128-132. IEEE Computer Society, (2013)LPRAM: a novel low-power high-performance RAM design with testability and scalability., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (5): 637-651 (2004)A Distributed Algorithm for Constructing an Independent Dominating Set., , , and . ICDCIT, volume 13145 of Lecture Notes in Computer Science, page 79-95. Springer, (2022)LPRAM: a low power DRAM with testability., and . ASP-DAC, page 390-393. IEEE Computer Society, (2004)Test Pattern Generation for Power Supply Droop Faults., , , , , and . VLSI Design, page 343-348. IEEE Computer Society, (2006)Distributed Node-Based Transmission Power Control for Wireless Ad Hoc Networks., and . ICDCIT, volume 4317 of Lecture Notes in Computer Science, page 49-62. Springer, (2006)A Fast Algorithm for Point Labeling Problem., , , and . CCCG, page 155-158. (2005)