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Digital modular control of high frequency DC-DC converters., , and . Microelectron. J., 45 (10): 1254-1260 (2014)Ultra low power capless LDO with dynamic biasing of derivative feedback., , , and . Microelectron. J., 44 (2): 94-102 (2013)Aging-Aware Power or Frequency Tuning With Predictive Fault Detection., , , , , , , , and . IEEE Des. Test Comput., 29 (5): 27-36 (2012)RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage., , , and . J. Electron. Test., 18 (2): 179-187 (2002)Low Power BIST by Filtering Non-Detecting Vectors., , , , , , , , , and . J. Electron. Test., 16 (3): 193-202 (2000)On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level., , , , , and . J. Electron. Test., 20 (4): 345-355 (2004)Modeling of Inherent Losses of Fully Integrated Switched Capacitor DC-DC Converters., , , and . J. Low Power Electron., 8 (5): 667-673 (2012)On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits., , , and . DFT, page 263-270. IEEE Computer Society, (1994)BIST Architectures and Fault Emulation., , and . LATW, page 55-60. IEEE, (2006)Low power BIST by filtering non-detecting vectors., , , , , , , , , and . ETW, page 165-170. IEEE Computer Society, (1999)