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SLS-a fast switch-level simulator for MOS.

, , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 7 (8): 838-849 (1988)

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SLS - a fast switch level simulator for verification and fault coverage analysis., , , , and . DAC, page 164-170. IEEE Computer Society Press, (1986)The reliability of approximate testability measures.. IEEE Des. Test, 5 (6): 57-67 (1988)Using a Hardware Simulation Engine for Custom MOS Structured Designs., , , and . IBM J. Res. Dev., 28 (5): 564-571 (1984)Diagnosing combinational logic designs using the single location at-a-time (SLAT) paradigm., , , and . ITC, page 287-296. IEEE Computer Society, (2001)Analysis and Design of Optimal Combinational Compactors., and . VTS, page 101-106. IEEE Computer Society, (2003)Fault simulation of logic designs on parallel processors with distributed memory., and . ITC, page 690-697. IEEE Computer Society, (1990)Correlations between path delays and the accuracy of performance prediction.. ITC, page 801-808. IEEE Computer Society, (1998)Diagnosis and characterization of timing-related defects by time-dependent light emission., , , , , , , , , and 1 other author(s). ITC, page 733-739. IEEE Computer Society, (1998)TRIM: testability range by ignoring the memory., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 7 (1): 38-49 (1988)The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability., , and . ITC, page 739-746. IEEE Computer Society, (1994)