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A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge.

, , , and . ATS, page 168-173. IEEE Computer Society, (2014)

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A design-for-test apparatus for measuring on-chip temperature with fine granularity., , , and . ISQED, page 27-32. IEEE, (2012)A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge., , , and . ATS, page 168-173. IEEE Computer Society, (2014)A comparative study of body biased time-to-digital converters based on stochastic arbiters and stochastic comparators., , , and . NEWCAS, page 1-4. IEEE, (2016)A stochastic sampling time-to-digital converter with tunable 180-770fs resolution, INL less than 0.6LSB, and selectable dynamic range offset., , , and . CICC, page 1-4. IEEE, (2013)A Flash TDC with 2.6-4.2ps Resolution Using a Group of UnbalancedCMOS Arbiters., , , , , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 97-A (3): 777-780 (2014)A novel test structure for measuring the threshold voltage variance in MOSFETs., , , and . ITC, page 1-8. IEEE Computer Society, (2013)A subsampling stochastic coarse-fine ADC with SNR 55.3dB and >5.8TS/s effective sample rate for an on-chip signal analyzer., , , and . ISCAS, page 93-96. IEEE, (2014)Bounding Communication Energy Overhead in Parallel Networks with Power-Delay Scalability., and . ICPADS, page 891-895. IEEE Computer Society, (2008)