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Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development.

, , , , , , and . VISSOFT, page 71-75. IEEE Computer Society, (2016)

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Super Resolution for Smartphones., , , , and . SIGMAP, page 106-112. SciTePress, (2016)Metrics Visualization Techniques Based on Historical Origins and Functional Layers for Developments by Multiple Organizations., , , , , , and . International Journal of Software Engineering and Knowledge Engineering, 28 (1): 123-148 (2018)Evaluating the work of experienced and inexperienced developers considering work difficulty in sotware development., , , , , and . SNPD, page 161-166. IEEE Computer Society, (2017)Metrics Visualization Technique Based on the Origins and Function Layers for OSS-Based Development., , , , , , and . VISSOFT, page 71-75. IEEE Computer Society, (2016)How Does Defect Removal Activity of Developer Vary with Development Experience?, , , , , , , , , and 2 other author(s). SEKE, page 540-545. KSI Research Inc. and Knowledge Systems Institute Graduate School, (2015)Effects of Organizational Changes on Product Metrics and Defects., , , , , , and . APSEC (1), page 132-139. IEEE Computer Society, (2013)978-1-4799-2143-0.Developer Experience Considering Work Difficulty in Software Development., , , , , and . Int. J. Networked Distributed Comput., 6 (2): 53-62 (2018)Empirical Study on Specification Metrics to Predict Volatility and Software Defects., , , , , and . TENCON, page 2479-2484. IEEE, (2018)