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Disambiguation of "Comte, Mariane"

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Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.

, , , , , and . ISVLSI, page 320-325. IEEE Computer Society, (2017)

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Mariane Schücking

Fabienne Comte

Mariane Reineck

Andreas Comte

Pia Comtesse-Weidner

 

Other publications of authors with the same name

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies., , , , and . J. Electron. Test., 33 (4): 515-527 (2017)Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions., , , , , and . ETS, page 1-2. IEEE, (2017)Which metrics to use for RF indirect test strategy?, , , , , and . SMACD, page 73-76. IEEE, (2019)Accurate and efficient analytical electrical model of antenna for NFC applications., , , , , , , and . NEWCAS, page 1-4. IEEE, (2013)Estimating Static Parameters of A-to-D Converters from Spectral Analysis., , , , , and . LATW, page 174-179. IEEE, (2002)ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator., , , , , , and . VLSI Design, (2008)A-to-D converters static error detection from dynamic parameter measurement., , , , and . Microelectron. J., 34 (10): 945-953 (2003)Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements., , , , , and . Microelectron. J., 45 (3): 336-344 (2014)Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies., , , , and . J. Electron. Test., 35 (1): 59-75 (2019)MIRID: Mixed-Mode IR-Drop Induced Delay Simulator., , , , , and . Asian Test Symposium, page 177-182. IEEE Computer Society, (2013)