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A ReRAM-Based Nonvolatile Flip-Flop With Self-Write-Termination Scheme for Frequent-OFF Fast-Wake-Up Nonvolatile Processors.

, , , , , , , , , , , , , , , , , and . IEEE J. Solid State Circuits, 52 (8): 2194-2207 (2017)

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An offset-tolerant current-sampling-based sense amplifier for Sub-100nA-cell-current nonvolatile memory., , , , , , , , , and 3 other author(s). ISSCC, page 206-208. IEEE, (2011)A 0.5V 4Mb logic-process compatible embedded resistive RAM (ReRAM) in 65nm CMOS using low-voltage current-mode sensing scheme with 45ns random read time., , , , , , , , and . ISSCC, page 434-436. IEEE, (2012)Area-Efficient Embedded Resistive RAM (ReRAM) Macros Using Logic-Process Vertical-Parasitic-BJT (VPBJT) Switches and Read-Disturb-Free Temperature-Aware Current-Mode Read Scheme., , , , , , , , , and . IEEE J. Solid State Circuits, 49 (4): 908-916 (2014)Self-Convergent Trimming SRAM True Random Number Generation With In-Cell Storage., , , , , and . IEEE J. Solid State Circuits, 54 (9): 2614-2621 (2019)A ReRAM Macro Using Dynamic Trip-Point-Mismatch Sampling Current-Mode Sense Amplifier and Low-DC Voltage-Mode Write-Termination Scheme Against Resistance and Write-Delay Variation., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 54 (2): 584-595 (2019)High Density Embedded 3D Stackable Via RRAM in Advanced MCU Applications., , , , , , , and . VLSI Technology and Circuits, page 1-2. IEEE, (2023)A novel single poly-silicon EEPROM using trench floating gate., , and . MTDT, page 35-37. IEEE Computer Society, (2005)A Low-Voltage Bulk-Drain-Driven Read Scheme for Sub-0.5 V 4 Mb 65 nm Logic-Process Compatible Embedded Resistive RAM (ReRAM) Macro., , , , , , , , , and . IEEE J. Solid State Circuits, 48 (9): 2250-2259 (2013)Low-cost logarithmic CMOS image sensing by nonlinear analog-to-digital conversion., , , and . IEEE Trans. Consumer Electronics, 51 (4): 1212-1217 (2005)Challenges and Circuit Techniques for Energy-Efficient On-Chip Nonvolatile Memory Using Memristive Devices., , , , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 5 (2): 183-193 (2015)