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Performance entitlement by exploiting transistor's BTI recovery., , , and . ISQED, page 341-346. IEEE, (2013)Controlling Aging in Timing-Critical Paths., , , and . IEEE Des. Test, 33 (4): 82-91 (2016)Pylon: Towards an integrated customizable volume diagnosis infrastructure., , , , , , and . ITC, page 1-9. IEEE, (2016)Counterfeit electronics: A rising threat in the semiconductor manufacturing industry., , and . ITC, page 1-4. IEEE Computer Society, (2013)Systematic defect detection methodology for volume diagnosis: A data mining perspective., , , , and . ITC, page 1-10. IEEE, (2017)A design-for-reliability approach based on grading library cells for aging effects., , , , and . ITC, page 1-7. IEEE Computer Society, (2013)Test data analytics - Exploring spatial and test-item correlations in production test data., , , , , , and . ITC, page 1-10. IEEE Computer Society, (2013)Asymmetric aging of clock networks in power efficient designs., , , , and . ISQED, page 484-486. IEEE, (2014)Special session 11B: ITRS adaptive test update.. VTS, page 1. IEEE Computer Society, (2014)Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations., , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)