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Novel March WY Approach for Dynamic Fault Detection in Memory BIST., , , , , and . MCSoC, page 516-521. IEEE, (2023)Statistical simulations of 6T-SRAM cell ageing using a reliability aware simulation flow., , , , , , , , , and 5 other author(s). ESSDERC, page 238-241. IEEE, (2015)RTN distribution comparison for bulk, FDSOI and FinFETs devices., , , and . Microelectron. Reliab., 54 (9-10): 1749-1752 (2014)Experimental evidences and simulations of trap generation along a percolation path., , , , , , , , , and . ESSDERC, page 226-229. IEEE, (2015)Generation of New Low-Complexity March Algorithms for Optimum Faults Detection in SRAM., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (8): 2738-2751 (2023)Novel March Test Algorithm Optimization Strategy for Improving Unlinked Faults Detection., , , and . APCCAS, page 117-120. IEEE, (2021)Modelling RTN and BTI in nanoscale MOSFETs from device to circuit: A review., , , , , , , and . Microelectron. Reliab., 54 (4): 682-697 (2014)Design of Multiplicative Inverse Value Generator using Logarithm Method for AES Algorithm., , , , and . ICM, page 1-5. IEEE, (2020)An Automation Program for March Algorithm Fault Detection Analysis., , , and . APCCAS, page 149-152. IEEE, (2021)