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Disambiguation of "Enichlmair, Hubert"

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Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor.

, , , and . Microelectron. Reliab., 47 (9-11): 1439-1443 (2007)

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Hubert Gabel

Hubert Mayerhofer

Hubert Hörterer

Thomas Hübert

Hubert Motschmann

 

Other publications of authors with the same name

Scalable High Voltage CMOS technology for Smart Power and sensor applications., , , , , , , , , and . Elektrotech. Informationstechnik, 125 (4): 109-117 (2008)Hot-carrier reliability in high-voltage lateral double-diffused MOS transistors., , , , , , and . IET Circuits Devices Syst., 2 (3): 347-353 (2008)Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures., , , , and . Microelectron. Reliab., 47 (4-5): 697-699 (2007)Statistical modelling of MOS transistor mismatch for high-voltage CMOS processes, , , and . Quality and Reliability Engineering International, 21 (5): 477--489 (2005)Interface traps density-of-states as a vital component for hot-carrier degradation modeling., , , , , , , , , and 4 other author(s). Microelectron. Reliab., 50 (9-11): 1267-1272 (2010)Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs., , , , , , , , and . Microelectron. Reliab., 55 (9-10): 1427-1432 (2015)An analytical approach for physical modeling of hot-carrier induced degradation., , , , , , , , and . Microelectron. Reliab., 51 (9-11): 1525-1529 (2011)Analysis of hot carrier effects in a 0.35 µm high voltage n-channel LDMOS transistor., , , and . Microelectron. Reliab., 47 (9-11): 1439-1443 (2007)