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Understanding the effects of NIR laser stimulation on NMOS transistor., , , , , and . Microelectron. Reliab., 44 (9-11): 1675-1680 (2004)Effect of physical defect on shmoos in CMOS DSM technologies., , , , , , , and . Microelectron. Reliab., 48 (8-9): 1333-1338 (2008)Generic simulator for faulty IC., , , , , and . Microelectron. Reliab., 48 (8-9): 1592-1596 (2008)Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased., , , , , and . Microelectron. Reliab., 42 (9-11): 1729-1734 (2002)Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory., , , , , , , and . Microelectron. Reliab., 51 (9-11): 1658-1661 (2011)Net integrity checking by optical localization techniques., , , and . Microelectron. Reliab., 49 (9-11): 1175-1181 (2009)Automated Diagnosis and Probing Flow for Fast Fault Localization in IC., , , , and . Microelectron. Reliab., 44 (9-11): 1553-1558 (2004)Evaluation of scanning capacitance microscopy sample preparation by focused ion beam., , , , , and . Microelectron. Reliab., 46 (9-11): 1554-1557 (2006)Effects of 1064 nm laser on MOS capacitor., , , , , , and . Microelectron. Reliab., 52 (9-10): 1816-1821 (2012)Short defect characterization based on TCR parameter extraction., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1563-1568 (2003)