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On the in-field functional testing of decode units in pipelined RISC processors.

, , , , , , , and . DFT, page 299-304. IEEE Computer Society, (2014)

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A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks., , , and . IEEE Trans. Computers, 69 (1): 87-98 (2020)A Multilabel Active Learning Framework for Microcontroller Performance Screening., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3436-3449 (October 2023)Development Flow for On-Line Core Self-Test of Automotive Microcontrollers., , , , and . IEEE Trans. Computers, 65 (3): 744-754 (2016)Industrial best practice: cases of study by automotive chip- makers., , , , , , , , , and 2 other author(s). DFT, page 1-6. IEEE, (2021)A suite of IEEE 1687 benchmark networks., , , , , , , , and . ITC, page 1-10. IEEE, (2016)U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration., , and . LOD (1), volume 14505 of Lecture Notes in Computer Science, page 364-378. Springer, (2023)Semi-Supervised Deep Learning for Microcontroller Performance Screening., , , , , and . ETS, page 1-6. IEEE, (2023)Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing., , , , , and . ETS, page 1-5. IEEE, (2023)Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor., , , , , and . ATS, page 73-78. IEEE, (2021)Software-based self-test techniques of computational modules in dual issue embedded processors., , , , , , , and . ETS, page 1-2. IEEE, (2015)