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On the in-field functional testing of decode units in pipelined RISC processors.

, , , , , , , and . DFT, page 299-304. IEEE Computer Society, (2014)

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On the in-field testing of spare modules in automotive microprocessors., , , , , and . VLSI-SoC, page 1-6. IEEE, (2017)Software-Based Self-Test Techniques for Dual-Issue Embedded Processors., , , , , and . IEEE Trans. Emerg. Top. Comput., 8 (2): 464-477 (2020)Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions., , , , , , , , and . DATE, page 920-923. IEEE, (2019)Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers., , , , and . DTIS, page 1-6. IEEE, (2018)Development Flow for On-Line Core Self-Test of Automotive Microcontrollers., , , , and . IEEE Trans. Computers, 65 (3): 744-754 (2016)On-line software-based self-test for ECC of embedded RAM memories., , , and . DFT, page 1-6. IEEE Computer Society, (2017)Software-based self-test techniques of computational modules in dual issue embedded processors., , , , , , , and . ETS, page 1-2. IEEE, (2015)In-field functional test programs development flow for embedded FPUs., , , , and . DFT, page 107-110. IEEE Computer Society, (2016)On the in-field functional testing of decode units in pipelined RISC processors., , , , , , , and . DFT, page 299-304. IEEE Computer Society, (2014)