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Web-Based Environment for Digital Electronics Test Tools., , , and . Virtual Enterprises and Collaborative Networks, volume 149 of IFIP, page 435-442. Kluwer/springer, (2004)Integrated Design and Test Generation Under Internet Based Environment MOSCITO., , , , , , , and . DSD, page 187-195. IEEE Computer Society, (2002)Collaborative Distributed Computing in the Field of Digital Electronics Testing., , and . BASYS, volume 322 of IFIP Advances in Information and Communication Technology, page 145-152. Springer, (2010)Distributed Approach for Genetic Test Generation in the Field of Digital Electronics., , and . IDC, volume 162 of Studies in Computational Intelligence, page 127-136. Springer, (2008)Distributed Fault Simulation with Collaborative Load Balancing for VLSI Circuits., , and . Scalable Comput. Pract. Exp., (2011)Internet-Based Collaborative Test Generation with MOSCITO., , , , , , , and . DATE, page 221-226. IEEE Computer Society, (2002)Web-Based Framework for Parallel Distributed Test., , and . DDECS, page 271-274. IEEE Computer Society, (2008)Collaborative Distributed Fault Simulation for Digital Electronic Circuits., , and . IDC, 315, page 67-76. (2010)Multi-Level Fault Simulation of Digital Systems on Decision Diagrams., , , and . DELTA, page 86-91. IEEE Computer Society, (2002)